一、前言随着科学技术的发展,许多尖端科技产品变得十分复杂,如超大规模集成电路、原子核反应堆、喷气式飞机等等都是极为庞杂的产品,由千万个元件器件组成,其中任一元件的老化失灵,就可能导致整个系统的故障,后果不堪设想。而从如此复杂的系统中检测出失灵元 I. INTRODUCTION With the development of science and technology, many cutting-edge technology products have become very complicated. For example, very large-scale integrated circuits, nuclear reactors, jets and so on are all extremely complicated products. They consist of tens of millions of components and devices, A component of the aging failure, it may lead to failure of the entire system, the consequences could be disastrous. And from such a complex system to detect the failure element