Line broadening in a diffraction intensity profile of powdered crystalline materials due to stacking fault has been characterized in terms of the zeroth, first,
Single crystals of L-Valinium picrate were grown from aqueous solution by slow evaporation technique. Single crystal X-ray diffraction analysis reveals that the
Zn(1-x)CdxO films have been grown on (a-plane) and (r-plane) sapphire substrate by metal organic chemical vapor deposition. A maximum cadmium incorporation of 8
It is well known that the native oxide layer on titanium (Ti) implants is responsible for its superior biocompatibility and tissue integration. Recent efforts h