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ＣＣＤ器件的可靠度及耐辐照能力关系到ＣＣＤ相机的工作寿命；ＣＣＤ器件的驱动方式及输出直流电平的抑制方法关系到是否充分发挥了ＣＣＤ器件的潜力；静电保护关系到ＣＣＤ器件自身的安全。利用加速寿命试验中获得的数据，通过分析，预估出ＣＣＤ器件的可靠度；分析了高能辐射对ＣＣＤ器件的影响；对模拟及数字驱动进行了分析并指出注意事项；比较了两种常见的抑制ＣＣＤ输出直流电平的方法，提出了应用过程中防静电措施。
The reliability and radiation resistance of CCD devices are related to the working life of CCD cameras. The driving methods of CCD devices and the method of suppressing the output DC level are related to the potential of CCD devices. The electrostatic protection is related to the safety of CCD devices . Based on the data obtained from the accelerated life test, the reliability of the CCD device is estimated through analysis. The influence of high-energy radiation on the CCD device is analyzed. The analog and digital driving are analyzed and pointed out. Two common Suppression CCD output DC level method, put forward the application of anti-static measures.