可控硅是一种常用的半导体元件,常易发生阳、阴极之间的电压过高时,发生击穿短路的故障。电路中产生过高电压的原因,一是静电感应,二是电感回路电流的突变,此外是控制极开路。可控硅是否完好,可以利用万用表判断,具体方法如下。1.首先用万用表测量阳极和阴极之间的电阻,无论黑表笔置哪个极,其阻值均应在几十千欧至几百千欧之间;阳极和控制极之间的电 SCR is a commonly used semiconductor components, often prone to positive and negative voltage between the cathode, breakdown breakdown occurs short circuit fault. Circuits have high voltage causes, one electrostatic induction, the second is the mutation of the inductor loop current, in addition to the control of the open circuit. SCR is intact, you can use the multimeter to determine the specific methods are as follows. 1. First of all, with a multimeter to measure the resistance between the anode and cathode, regardless of the black table pen which pole, the resistance should be between tens of thousands of Europe to hundreds of thousands of Europe; between the anode and the control electrode