大多数的岩土材料,像土、石材和许多建筑材料,都存在着复杂的多层次孔隙结构,其孔隙尺寸一般从纳米级到宏观尺度不等。要优化这些材料的性能,一个关键因素就是如何表征和控制其多尺度的孔隙结构。以前的技术无法研究长度范围在0.1nm到几百nm之间的三维空间结构,而采用高分辨率的软X射线显微镜可以弥补这个缺陷,并集中展示其在胶凝材料研究中的应用。 Most geotechnical materials, such as earth, stone and many building materials, have complex, multi-level pore structures that typically range in pore size from nanoscale to macroscopic scales. A key factor in optimizing the performance of these materials is how to characterize and control their multi-scale pore structure. Previous techniques failed to study three-dimensional structures ranging in length from 0.1 nm to several hundreds of nm. The use of a high-resolution soft X-ray microscope compensates for this defect and focuses on its application in the study of cementitious materials.