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Oxide p - n junctions of p-SrIn0.1Ti0.9O3/n-SrNb0.01Ti0.99O3 (SITO/SNTO) are fabricated by laser molecular beam epitaxy. The current-voltage characteristics of the SITO/SNTO p - n junction are investigated mainly in the temperature range of 300-400 K. The SITO//SNTO junction exhibited good rectifying behaviour over the whole temperature range. Our results indicate a possibility of application of oxide p - n junction in higher temperatures in future electronic devices.