很久以来,光学显微镜的分辨率受限于光学衍射极限.最近几年,发展了很多突破光学衍射极限的技术方法.其中,受激发射损耗(stimulated emission depletion,STED)显微镜因能够提供超快超高的分辨率而备受关注.在这类方法中,脉冲式STED分辨率较高但搭建复杂;连续光STED虽然搭建简单,但分辨率有所下降;时间门调制STED(gated-STED,g STED)在简化STED搭建的同时,又可以实现与脉冲式STED相比拟的分辨率.本文详细介绍了时间门在STED纳米显微镜中的应用. For a long time, the resolution of optical microscopes has been limited by the optical diffraction limit. In recent years, many technological methods have been developed to overcome the optical diffraction limit, in which stimulated emission depletion (STED) High resolution and high concern. In these methods, pulse STED resolution higher but complex structures; continuous light STED although simple to build, but the resolution decreased; time gate modulation STED (gated-STED, g STED) can simplify the construction of STED and at the same time, it can achieve the resolution compared with pulse STED.This paper introduces the application of time gate in STED nanometer microscope.