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用共振光电子出现电势谱(RPAPS)对真空封接用可伐合金的表面进行了分析,并与俄歇电子谱(AES)和X射线光电子谱(XPS)进行比较。发现RPAPS可容易地分辨出杂质锰和铬,而AES和XPS则不能。由此可见RPAPS可能是一种重要的分析合金表面杂质的工具。
The surface of Kovar alloy for vacuum sealing was analyzed by resonance photoelectron potential spectroscopy (RPAPS) and compared with Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS). RPAPS was found to readily distinguish between impurity manganese and chromium, while AES and XPS did not. This shows that RPAPS may be an important tool for analyzing the surface of alloy impurities.