论文部分内容阅读
利用热释电晶体实现了一个X射线激发源,并以此激发源和高能量分辨率的硅漂移探测器构建了一个X射线荧光分析谱仪。首先通过分析计算热释电晶体厚度和靶厚度对产生X射线的影响选定了激发源的设计参数;然后测量了激发源发射的X射线本底,其能量范围在1~27keV,包含有Cu和Ta的特征X射线,最大强度在每秒3 000个计数以上,对本底的测量同时显示出谱仪的探测器部分对Cu的8.05keV特征峰的分辨率达到210eV,具有很高的能量分辨率;最后使用该谱仪测试了Fe,Ti和Cr等三种单质样品和高钛玄武岩样品,测试结果表明该谱仪可以有效的分析出样品的元素成分。由于这种X射线荧光分析谱仪的各组成部分体积都很小,进一步便携化后非常适合于非破坏、现场和快速的元素分析场合。
An X-ray fluorescence spectrometer was constructed using pyroelectric crystal as an X-ray excitation source, using this excitation source and high-energy-resolution silicon drift detector. First, the design parameters of the excitation source were selected by analyzing the effect of the thickness of the pyroelectric crystal and the thickness of the target on the X-ray generation. The X-ray background of the excitation source was measured and its energy range was 1 ~ 27keV, including Cu And Ta’s characteristic X-ray, the maximum intensity is above 3 000 counts per second. The measurement of the background also shows that the detector part of the spectrometer has a resolution of 210 eV for the 8.05 keV characteristic peak of Cu with a high energy resolution Finally, the spectrometer was used to test Fe, Ti and Cr three kinds of simple substance samples and high titanium basalt samples, the test results show that the spectrometer can effectively analyze the elemental composition of the sample. Due to the small size of each component of the XRF spectrometer, it is ideal for nondestructive, on-site and rapid elemental analysis after further portability.