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应用X－射线光电子能谱，通过离子刻蚀，原位研究第四周期过渡金属与氧化铝所形成界而的化学状态．结果表明，Cr、Fe在界面处有不同程度的氧化，氧化程度Cr＞Fe，而Cu则无明显氧化．化学成份的定量分析表明，界面过渡层的厚度与界而化学反应强弱直接相关．
X-ray photoelectron spectroscopy (XPS) was used to study the chemical state of the boundary between transition metal and alumina in the fourth cycle by ion etching. The results show that Cr and Fe have different degrees of oxidation at the interface, the degree of oxidation of Cr> Fe, while the oxidation of Cu is not obvious. The quantitative analysis of chemical composition shows that the thickness of interfacial transition layer is directly related to the boundary and the chemical reaction intensity.