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本文着重探讨了在考虑组成器件的不同层材料之间的折射率差时，对器件的性能进行分析的方法，并与ＫａｔｓｕｍｉＫｉｓｈｉｎｏ和Ｍ．ＳｅｌｉｍＵｎｌü提出的分析方法进行了比较。指出当折射率相差较小时（＜±０．６），两种分析方法所得出的最佳峰值量子效率随折射率的变化特性极为近似，但在响应光谱结构上存在着差别；而当折射率相差较大时，采用两种分析方法所得结果之间的差别很大。本文的分析结果更接近于实际情况
This article focuses on ways to analyze the performance of devices when considering the difference in refractive index between the different layers that make up the device, in conjunction with Katsumi Kishino and M. The analysis method proposed by SelimUnlü is compared. It is pointed out that the best peak quantum efficiencies obtained by the two methods are very similar with the change of refractive index when there is a small difference in refractive index (<± 0.6), but there is a difference in the structure of the response spectrum. When the refractive index When the difference is large, the difference between the results obtained by the two methods of analysis is very large. The result of this paper is closer to the actual situation