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电子衍射图分析是电镜在材料研究中的基本工作。由于这种分析常需要作大量繁复的计算,所以计算机的应用十分必要。在微机较为普及的今天,深入研究并推广计算机在这方面的应用是一项值得重视的工作。为此,我们根据日常电镜工作的需要,用FOR-TRANⅣ语言建立了一套较完整的程序,可以完成单晶衍射花样(包括高阶劳埃斑)的标定,多晶衍射环的标定、孪晶关系的判定和孪晶合成衍射图的标定以及已知取向关系的两相合成衍射图的标定,一般可用于所有晶系。我们在PDP11/44小型机上运用这些程序成功地解决了一些材料研究中提出的实际问题。本文希望通过介绍这些应用实例引起大家对这项工作的重视。本文列举的各程序所依据的原理可参阅有关文献,其中单晶衍射花样的标定基本上采用了文
Electron diffraction pattern analysis is the basic work of electron microscopy in material research. Because of this analysis often requires a lot of complicated calculations, so the application of the computer is necessary. In the more popular computer today, in-depth study and promotion of computer applications in this area is a work worthy of attention. Therefore, based on the needs of daily electromicroscopy, we have established a complete set of procedures using FOR-TRANⅣ language to complete the calibration of single crystal diffraction patterns (including high-order Laue), the calibration of polycrystalline diffraction rings, The determination of the crystal relationship and the calibration of the twinned diffraction pattern and the calibration of the two-phase synthetic diffraction pattern of the known orientation relationship are generally applicable to all crystal systems. Our use of these procedures on the PDP11 / 44 minicomputer has successfully solved some of the practical issues raised in material research. This article hopes to introduce the application examples to draw everyone’s attention to this work. This article lists the procedures based on the principle can refer to the relevant literature, in which the single crystal diffraction pattern calibration basically uses the text