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本文用塞曼效应石墨炉原子吸收光谱分析法(ZAAS)对淬火-固态再结晶制备Hg_(1-x)Cd_xTe材料的工艺进行了研究,探讨并建立了高纯原料(Te、Cd)、制备晶体的容器(石英、玻璃)及Hg_(1-x)Cd_xTe材料中杂质分析方法。结果表明:ZAAS法是Hg_(1-x)Cd_xTe材料研究中一种重要的痕量分析手段。
In this paper, the preparation of Hg_ (1-x) Cd_xTe material by quenching-solid state recrystallization was studied by Zeeman effect graphite furnace atomic absorption spectrometry (ZAAS) Crystal Containers (Quartz, Glass) and Impurities in Hg_ (1-x) Cd_xTe Materials. The results show that ZAAS is an important trace analysis method in the study of Hg_ (1-x) Cd_xTe materials.