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多年来X射线荧光分析在化学元素分析方面起了很重要的作用。近十几年来发展起来的同步幅射x射线源显示了x射线激发技术革命性的进步。用同步幅射(SR)进行x射线荧光分析(xRF),使研究者可获得高灵敏度和相当高的分辨率。SR所获的结果表明,测量的最小空间分辨率可小于100μm~2,在300秒时间内最小检测限(MDL)约为1fg(即10~(-15)克)。习惯上使用xRF方法,主要是因为它具有多元素检测能力,试样无需特殊制备,对试样的损伤小,并能在大气压下对固体、液体、或气体进行分析等优点。SR源不但保持了所有这些优点,并且为开拓xRF方法提供了新的前景。譬如痕量元素x射线显微镜可用于显示小于1ppm(重量)
X-ray fluorescence analysis has played a very important role in chemical elemental analysis for many years. Synchrotron x-ray sources developed over the past decade have shown revolutionary advances in x-ray excitation technology. X-ray fluorescence analysis (xRF) with synchronized radiations (SR) enables researchers to achieve high sensitivity and high resolution. The results obtained by SR show that the minimum spatial resolution of measurement can be less than 100μm ~ 2 and the minimum detectable limit (MDL) is about 1fg (ie, 10 ~ (-15) g) in 300 seconds. It is customary to use the xRF method mainly because of its multi-element detection capability, the absence of special preparation of the sample, the small damage to the sample, and the ability to analyze solids, liquids, or gases at atmospheric pressure. The SR source not only retains all these advantages, but also opens up new prospects for pioneering the xRF approach. For example, trace element x-ray microscope can be used to display less than 1ppm (weight)