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为了满足激光等离子体X射线波长测量的需要,在辅助光阑法的基础上,从理论上提出了一种用平面晶体谱仪确定波长的新方法.发展了改进的辅助光阑法来确定晶体面与记录面的交线到第一条辅助光阑的距离,并且利用某一条谱线的曲率得到记录面与晶体表面的夹角.这两个参量在一般的辅助光阑法中需借用参考谱线得到,而采用新的方法可在不使用任何参考谱线的情况下得到所有光谱线的波长.实际使用中通过增大光阑间的间距,根据不同的波长范围调节晶体与记录面的相对位置,可使波长的测量精度达1×10-3nm.
In order to meet the needs of X-ray wavelength measurement of laser plasma, a new method to determine the wavelength by using a planar crystal spectrometer is proposed theoretically based on the auxiliary aperture method.An improved auxiliary aperture method is developed to determine the crystal Surface and the recording surface of the line to the first auxiliary aperture distance, and the use of a line of curvature of the recording surface and the angle between the crystal surface.These two parameters in the general auxiliary aperture method to be borrowed reference The new method is used to obtain the wavelength of all the spectral lines without any reference line, and in actual use, the spacing between the apertures is adjusted to adjust the difference between the crystal and the recording surface according to different wavelength ranges Relative position, can make the wavelength measurement accuracy of 1 × 10-3nm.