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SRAM型FPGA空间应用日益增多,只有针对其特点设计相应的单粒子试验的测试程序才能系统、准确地获取该类芯片的单粒子翻转特性,为抗辐射加固设计提供依据。阐述了单粒子翻转的静态和动态的测试方法。静态测试包括硬件设计和配置位回读程序的设计;动态测试主要针对CLB(配置逻辑单元)和BRAM(块存储器)两部分进行了相应的软件测试程序设计;并结合工程给出了解决单粒子翻转的主要加固方法。此试验得到了该类芯片的单粒子翻转截面,对在地面上进行FPGA的可靠性评估具有重要意义。
The application space of SRAM type FPGA is increasing day by day. Only the test program of single-particle test designed for its characteristics can obtain the single-particle flip characteristic of this type of chip systematically and accurately and provide the basis for anti-radiation reinforcement design. The static and dynamic test methods of single particle flip are described. The static test includes the design of the hardware design and the configuration bit readback program. The dynamic test mainly designs the software test program for the two parts of CLB (configuration logic unit) and BRAM (block memory). Combined with the project, Flip the main reinforcement method. This test has been single-chip flip-chip section of this type of chip, on the ground for FPGA reliability assessment is of great significance.