A simple division of close-aperture Z-scan curve by open-aperture Z-scan is conveniently used to obtain the nonlinear refractive index. It usually causes an error, which even reaches up to over 50% for Z-scan measurements with a pinhole or a medium with a high nonlinear absorption. Here the influence of nonlinear absorption on the determination of nonlinear refraction by Z-scan is analysed. We suggest that the error can be reduced greatly by a simple analysis of the symmetric features (symmetric method) of Z-scan curves from the closed-aperture Z-scan curve. As an example, experiments were carried out on CS2 solution of Ceo derivative, symmetric method agrees well with exact simulation.