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为了研究准分形结构光子晶体滤波器制作过程中引入的层厚误差微扰对其性能的影响,并得出准分形结构光子晶体滤波器的层厚误差容限,通过向正负折射率介质层加入不同的层厚微扰,分析了含负材料准分形结构光子晶体滤波器制作过程中的层厚微扰对其性能的影响。得到透射峰移动随介质折射率、介质层层数和层厚微扰大小的变化规律。对每层加入随机几何层厚微扰的情况进行了仿真,得到透射峰移动位置的统计图,并分析了透射峰位置统计数字特征随随机微扰的变化趋势。总结出含负材料准分形结构光子晶体滤波器在密集波分复用(DWDM)通信系统中的随机几何层厚误差容限为0.01 nm。
In order to study the influence of the layer thickness error perturbation introduced in the fabrication process of the quasi-fractal photonic crystal filter on its performance, and get the error tolerance of the layer thickness of the quasi-fractal photonic crystal filter, By adding different perturbation of layer thickness, the influence of layer thickness perturbation on the performance of quasi-fractal photonic crystal filter with negative material is analyzed. The variation of transmission peak with the medium refractive index, the number of dielectric layers and the perturbation of layer thickness were obtained. The stochastic perturbation of stochastic geometry is added to each layer, and the statistic chart of the moving position of the transmission peak is obtained. The variation trend of the statistical characteristics of the transmission peak with the random perturbation is analyzed. The error tolerance of stochastic geometrical layer thickness in a dense wavelength division multiplexing (DWDM) communication system with a quasi-fractal photonic crystal filter with negative material is summarized as 0.01 nm.