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场离子显微镜(FIM)是一种具有高分辨高放大倍数且能直接观察到固体表面单个原子的技术,将FIM与飞行时间质谱计配合构成原子探针——场离子显微镜(AP-F_2M)可鉴别极微区域(几nm)的化学成份,因此是研究材料微结构的有力工具。本文用AP-FIM研究了Al-Ni-Co永磁材料的微结构。用场离子显微镜观察了合金中沉淀相的形貌并用原子探针测定了不同沉淀相的化学成份及数量合金元素在沉淀相中分布。结果表明,合金中存在富铝相,富镍-钴相铁-钴-镍桐,少量Ce及Cu分布在富镍-钴相中。
Field-ion microscopy (FIM) is a technique with high resolution and high magnification that directly observes a single atom on a solid surface. Combining FIM with a time of flight mass spectrometer to make an atomic probe, a field-ion microscope (AP-F_2M) Identifying the chemical composition in the very small area (a few nm) is therefore a powerful tool for studying the microstructure of materials. In this paper, AP-FIM was used to study the microstructure of Al-Ni-Co permanent magnetic materials. The morphology of the precipitated phase in the alloy was observed with a field ion microscope and the chemical composition and the amount of alloying elements in the precipitated phase were determined by atomic probe. The results show that there are Al-rich phase and Ni-Co-rich phase in the alloy with a small amount of Ce and Cu distributed in Ni-Co-rich phase.