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介绍了混响室测试法的工作原理,并通过对GTEM法与混响室法的测试方法和测试结果的对比分析,表明混响室测试方法在1 GHz以上的高频范围测量集成电路(IC)的辐射敏感度更有优势。
The working principle of the reverberation chamber test method is introduced. The comparison and analysis of the test methods and the test results between the GTEM method and the reverberation chamber method show that the reverberation chamber test method can measure the frequency of the integrated circuit ) Radiation sensitivity is more advantageous.