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文章简要地介绍了一种由自制微型薄膜电阻加热台和商用扫描力显微镜构成的变温扫描力显微镜系统 ,获得的样品最高温度达 2 15℃ .运用该系统对铁电和铁磁畴随温度的演变进行了研究 ,在TGS单晶和人工磁化的高密度软磁盘磁记录材料中分别观察到了居里点附近发生的铁电 -顺电及铁磁 -顺磁相变 .文中还介绍了变温扫描力显微镜在其他材料领域的微区物性研究中应用的可能性 .
The article briefly introduces a temperature-changing scanning force microscopy system consisting of a self-made miniature film resistive heating stage and a commercial scanning microscope, and the highest temperature of the obtained sample is up to 2 15 ° C. The system is used to measure the temperature dependence of the ferroelectric and ferromagnetic domains Evolution of ferromagnetic-paraelectric and ferromagnetic-paramagnetic phase transitions were observed in TGS single crystal and artificial magnetized high density soft magnetic disk magnetic recording materials respectively.The temperature scanning scanning microscope Potential for application in the study of micromorphology in other materials.