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相位测量偏折术中的相位误差主要分为CCD相机的随机误差以及由结构光照明光源与CCD相机的非线性响应导致的非线性误差。从影响相位误差的根源分析,建立了条纹质量与相位误差、相机镜头光圈数、编码条纹的周期、调制度等因素的分析模型,并对该模型的可靠性与正确性进行仿真与实验验证。理论分析、仿真与实验结果表明:获取条纹的对比度与相机镜头光圈数、编码条纹的周期和调制度成正比,获取条纹的正弦性与相机镜头光圈数、编码条纹的周期及调制度成反比。根据该条纹质量分析模型优化系统参数,可以获得高质量的条纹。该条纹质量分析模型同样适用于面结构光三维测量等其他技术。
The phase error in phase measurement deflecting is mainly divided into the random error of CCD camera and the nonlinear error caused by the nonlinear response of structured light illumination source and CCD camera. Based on the analysis of the root causes of the phase errors, the analysis models of factors such as the fringe quality and phase error, the number of aperture of the camera lens, the period of the code fringes and the modulation degree are established. The reliability and correctness of the model are verified by simulation and experiment. Theoretical analysis, simulation and experimental results show that the contrast of the stripe obtained is proportional to the number of aperture and encoder stripe and the degree of modulation of the camera lens. The sine of the stripe obtained is inversely proportional to the number of aperture of the camera lens and the period and modulation of the encoded stripe. According to the streak quality analysis model to optimize system parameters, high quality streaks can be obtained. The streak quality analysis model is also applicable to other technologies such as three-dimensional measurement of surface structure light.