论文部分内容阅读
磺化酞菁铜多层膜体系是利用Langmuir-Blodgett技术制备的有序有机分子膜,它对于XPS测试有很好的稳定性,本文在固定电子出射角的条件下利用XPS方法研究了不同厚度的膜样品中Cu_((2(?))_(3/2))、Ni_(1(?))、S_(2p)峰强度的变化规律,讨论了膜内分子有序排列引起的散射效应对电子平均自由程的影响。
The sulfonated copper phthalocyanine multilayered film system is an ordered organic molecular film prepared by Langmuir-Blodgett technology, which has good stability for XPS test. In this paper, XPS method was used to study the effects of different thickness (2 (?)) _ (3/2)), Ni_ (1 (?)), And S_ (2p) in the film samples were investigated. The scattering effects caused by the orderly arrangement of the molecules in the film Impact on the mean free path of electrons.