用特征矩阵法研究了窄带缺陷模在入射角缓慢变化中的变化规律。结果表明:随着入射角的缓慢增大,可以使s(或p)偏振光的缺陷模的强度由小变大,再由大变小,缺陷模的波长稍微变短,然后重复前边的变化过程。随着入射角的增大,s偏振光的缺陷模的变化要比而p偏振光的缺陷模的变化快。在一定的入射角下,很小的入射角的变化,就可以改变缺陷模的偏振性。 The characteristic matrix method was used to study the variation of narrow-band defect mode in the slow variation of incident angle. The results show that the intensity of the defect mode of s (or p) polarized light increases from small to large, and the wavelength of the defect mode becomes slightly shorter as the incident angle increases slowly, and then the former changes process. As the incident angle increases, the defect modes of s-polarized light change more rapidly than those of p-polarized light. In a certain angle of incidence, a small angle of incidence changes, you can change the defect mode polarization.