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采用ＦＴ－Ｒａｍ ａｎ 光谱仪对蛋白质样品进行了多次扫描，以去卷积谱、二阶及四阶导数谱为参考确定各子峰峰位。采用酰胺Ⅰ带的原始谱图作曲线拟合， 并以子峰面积表征对应二级结构含量。用所建立的方法研究了多种蛋白质二级结构， 与其他测试方法相比得到基本一致的结果
The protein samples were scanned several times by FT-Ram an spectrometer, and the peak position of each sub-peak was determined by using the deconvolution spectrum, second-order and fourth-order derivative spectra as reference. The original spectrum of amide Ⅰ band was used as curve fitting, and the corresponding secondary structure content was characterized by sub-peak area. A variety of protein secondary structures were studied using the established method, with essentially the same results as the other test methods