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通过对A版(初减薄)和B版(终减薄)中波320×256碲镉汞红外焦平面探测器组件进行可靠性试验,并对其试验后的光电特性进行比较,最终给出B版焦平面探测器组件工作寿命的初步评价。
Through the reliability test of the A wave (initial thinning) and the B (final thinning) medium wave 320 × 256 HgCdTe infrared focal plane detector assembly, and comparing the photoelectric characteristics after the test, the final result is given Preliminary evaluation of working life of B - type focal plane detector.