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自动测试设备(ATE,Automatic Test Equipment)中的开关矩阵由于使用不均衡,有些开关因频繁使用发生故障而有些开关却很少使用.开关故障会导致开关矩阵的拓扑结构发生改变,使路径的搜索变得复杂化.为了解决开关使用均衡的问题以及复杂开关拓扑结构下的路径搜索问题,定义了路径节点矩阵、开关状态矩阵以及可达矩阵,统一了开关矩阵的数学描述,并提出了基于可达矩阵的路径搜索算法;定义了开关及路径的可靠度,提出了基于可靠性的路径选择标准,解决了开关矩阵使用不均衡的问题;通过实例进行了算法验证.结果表明:该算法能够实现开关故障情况下的路径搜索、路径选择的优化和开关使用的均衡.
Some switches are rarely used because of the unbalanced use of switch matrices in automatic test equipment (ATE). Some switches are rarely used due to frequent use failures. Switching faults can cause the topology of the switch matrix to change, In order to solve the problem of balanced use of switches and the problem of path search in complex switch topology, the path node matrix, switch state matrix and reachability matrix are defined and the mathematical description of the switch matrix is unified. Which can solve the problem of unbalanced use of switch matrices. An example is given to verify the algorithm. The results show that the algorithm can realize the reliability of switch and path, and put forward the path selection criterion based on reliability, Path search in case of switch failure, optimization of path selection, and balance of switch usage.