近场扫描光学显微镜（ＮＳＯＭ）中，切向力的检测有两种方法：光学检测法和非光学检测法．目前普遍采用的非光学检测法，基本上是采用压电陶瓷产生振荡，检测振幅在切向力作用下的衰减，从而控制探针和样品的距离．文中提出了一种新型的近场距离控制方法，即利用双压电片产生振荡和进行检测．实验结果表明，此法可明显提高检测灵敏度． Near-field scanning optical microscopy (NSOM), the tangential force detection There are two ways: optical detection and non-optical detection. The current non-optical detection method is basically the use of piezoelectric ceramic oscillation, the amplitude of detection under the tangential force attenuation, in order to control the distance between the probe and the sample. In this paper, a new near-field distance control method is proposed, that is, the use of bimorph vibration and detection. Experimental results show that this method can significantly improve the detection sensitivity.