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对电子、低能γ射线和X射线穿透几种不同厚度的Fe、Cu和Ta薄膜时所产生的次级电子及次级X射线进行了实验测量，并对影响次级电子和次级X射线强度的因素进行了分析。
Electron, low-energy γ-rays and X-rays were experimentally measured when they penetrated several different thicknesses of Fe, Cu and Ta thin films and their effects on secondary electrons and secondary X-rays The strength of the factors were analyzed.