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报道了利用增益开关半导体激光器产生超短光脉冲的实验结果，研制了适合测量半导体激光器超短光脉冲宽度的强度自相关测试系统，测得其脉宽为４０ｐｓ．
The experimental results of using gain switched semiconductor laser to generate ultrashort optical pulses are reported. An intensity autocorrelation test system suitable for measuring ultrashort optical pulse width of semiconductor laser is developed. The measured pulse width is 40ps.