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本文用随机徘徊模型分析每鉴相一次后调整一步的全数字锁相坏在噪声干扰下的性能,导出评价锁相环各种性能的计算式并算出几种性能曲线供设计电路时参考。
In this paper, we analyze the performance of one-phase all-digital phase-locking under noise interference by using a random hovering model to analyze the performance of each phase-locked loop, and calculate several performance curves for reference when designing the circuit.