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集成电路的应用对集成电路动态参数的测试提出了越来越高的要求。本文介绍了符合测试规范,原理上比较简单,测试速度较快的自动测试方法。
The application of integrated circuits has raised higher and higher requirements on the testing of dynamic parameters of integrated circuits. This article describes the automatic test method in line with the test specification, the principle is relatively simple, fast test.