This paper proposes a behavioral modeling technique for the second-generation switched-current building block circuits. The proposed models are capable of capturing the non-ideal behavior of switched-current circuits, which includes the charge injection effects and device mismatch effects. As a result, system performance degradations due to the building block imperfections can be detected at the early design stage by fast behavioral simulations. To evaluate the accuracy of the proposed models, we developed a time-domain behavioral simulator. Experimental results have shown that compared with SPICE, the behavioral modeling error is less than 2.15%, while behavioral simulation speed up is 4 orders in time-domain.