近年来,随着计算机的广泛应用,程序控制的设备愈来愈多。电子测量的自动化,对系统的定时部分也提出了可程控的要求。在集成电路自动测试系统中,就需要一个可程控的定时装置。本文所介绍的就是一个用于集成电路自动测试系统的定时装置,它也可用于其他对脉冲的周期、延迟及宽度需要程序控制的场合。用于集成电路自动测试系统的程控定时装置有三个基本要求:(1)多相,这是因为很多半导体器件,特别是动态MOS器件需要多相周期相同而延迟及宽度不一的定时脉冲。 In recent years, with the extensive application of computers, more and more devices have been controlled by programs. Electronic measurement automation, the timing part of the system also proposed a programmable request. In the IC automatic test system, you need a programmable timing device. This article describes a timing device used in automated test systems for integrated circuits. It can also be used in other applications where cycle, delay, and width of the pulse require program control. There are three basic requirements for programmed timing devices used in IC test systems: (1) Multiphase, because many semiconductor devices, especially dynamic MOS devices, require timing pulses with the same multiphase period but different delays and widths.