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利用背散射电子衍射微织构分析技术及X射线衍射织构分析技术,结合对取向硅钢薄带再结晶各阶段退火板磁性能的分析,系统研究了其形变再结晶过程中的组织及织构演变.结果表明,薄带内原始高斯晶粒取向发生绕TD轴向{111}〈112〉的转变,同时晶粒取向还表现出绕RD轴的附加转动,这种附加转动及其导致的表层微弱立方形变组织可为再结晶立方织构的形成提供核心.退火各阶段样品磁性能的变化对应了{110}-{100}〈001〉有益织构及其他织构的强弱转变以及再结晶晶粒不均匀程度的变化,综合织构类型及晶粒尺寸的变化推断发生了二次及三次再结晶过程.升温过程再结晶织构演变主要体现了织构诱发机制,也即与基体存在绕〈001〉轴取向关系的晶粒长大优势结合高斯织构的抑制效应发挥作用;而在高温长时间保温后三次再结晶过程,{110}低表面能诱发异常长大发挥主要作用使得最终得到锋锐的高斯织构.
Using backscattering electron diffraction (OM) micro-texture analysis technology and X-ray diffraction texture analysis technology, combined with the analysis of the magnetic properties of annealed sheets during the recrystallization of oriented silicon steel strip, the microstructure and texture The results show that the original Gaussian grain orientation in the ribbon transforms around the TD axis {111} <112>, and the grain orientation also shows additional rotation around the RD axis. This additional rotation and the resulting surface layer The weak cubic deformed microstructure can provide the core for the formation of recrystallized cubic texture.The changes of magnetic properties of samples during each stage of annealing correspond to the strong and weak transformations of {110} - {100} <001> beneficial texture and other textures and recrystallization The results show that the secondary and tertiary recrystallization processes are inferred from the change of the degree of grain heterogeneity, the comprehensive texture type and the grain size change.The recrystallization texture evolution during the heating process mainly embodies the texture inducing mechanism, that is, The grain growth of <001> axial orientation plays an important role in combination with the inhibitory effect of Gaussian texture. However, the {110} low surface energy induces abnormal growth in the process of three recrystallization after heat preservation for a long time at high temperature Gaussian sharpened action causes the finally obtained texture.