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研究X射线二极管(XRD)时间特性.XRD是构成软X射线能谱仪的主要部件,它用于激光等离子体发射软X射线谱测量.实验利用激光聚变研究中心的200TW激光器(激光能量~6J,脉冲宽度~30fs)打金箔靶产生的X射线发射谱,用滤片(Al)-XRD探测系统测量,探测信号由高频电缆(SUJ-50-10)传输和宽带示波器(TDS694C和TDS6604B)记录.实验数据进行了线性拟合和比对分析.
(XRD) was used to study the time characteristics of X-ray diode (XRD). XRD was the main component of the soft X-ray energy spectrometer and was used to measure the soft X-ray spectrum of the laser plasma.Using the laser system of 200TW laser , Pulse width ~ 30fs) to make the X-ray emission spectrum produced by the gold foil target. The detection signal was transmitted by the high frequency cable (SUJ-50-10) and the wideband oscilloscope (TDS694C and TDS6604B) Record experimental data were linear fit and comparative analysis.