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4月27日至4月29日在上海市松江县召开了上海市“硅单晶”及“硅的旋涡缺陷检测方法”标准审定会。会议是在国家标准总局、上海市经委、科委的领导下召开的。出席会议的有:国家标准总局、上海市经委、科委、冶金局、计量局及市有关局、公司的领导机关和上海市硅材料和半导体元器件生产厂家、高等院校、研究所等43个单位,共92名代表。
April 27 to April 29 held in Shanghai’s Songjiang County in Shanghai, “silicon single crystal” and “silicon vortex defect detection method” standard validation. The meeting was held under the leadership of the State Administration of Standards, Shanghai Economic Commission and the Shanghai Science and Technology Commission. Those attending the meeting were: General Administration of Press of China, Shanghai Municipal Commission of Economic Affairs, Science and Technology Commission, Metallurgical Bureau, Bureau of Metrology and Municipal Bureau, leading organ of the company and Shanghai silicon materials and semiconductor components manufacturers, universities, research institutes, etc. 43 A total of 92 representatives.