本文综述了静态二次离子质谱(SSIMS)的工作原理;与X射线光电子能谱和俄歇电子能谱的功能比较及SSIMS在聚合物表面研究中的最新进展。 用SSIMS技术,表征聚合物表面结构和表面反应,可得到仅数个原子层厚度的表面层结构信息,包括结构相近聚合物的特征“指纹区”数据和X射线光电子能谱不能检测到的水解反应半定量数据。SSIMS可同时检测聚合物表面的多种痕量元素,分析灵敏度达毫微克/克级。用SSIMS作聚合物表面形貌观察时,图像的立体析象清晰度可达50μ。 This review summarizes the working principle of static secondary ion mass spectrometry (SSIMS), comparison with X-ray photoelectron spectroscopy and Auger electron spectroscopy, and recent progress of SSIMS in polymer surface research. Using the SSIMS technique to characterize the surface structure and surface reactions of polymers, surface layer structure information of only several atomic layer thicknesses can be obtained, including “fingerprinting” data of structurally similar polymers and hydrolysis undetectable by X-ray photoelectron spectroscopy Response to semi-quantitative data. SSIMS detects multiple trace elements on the polymer surface at the same time with analytical sensitivity of nanogram / gram. When SSIMS was used as the surface morphology of the polymer, the resolution of the image was up to 50μ.