论文部分内容阅读
三维内应力分析目前常用冻结切片法和散光法进行测量。1970年Н.К.АЬеn提出改变入射光偏振状态或波长来求解各片层的平面应力.迄今,三维主应力σ_1,σ_2及σ_3的测量与分析还未见有完满的光学切片法。本文对板形受力构件推广了Н.К.АЬеn的方法,改变入射光的波长,在三个方向进行偏光特性测量,而在厚度方向与干涉光弹或全息光弹结合,这样,通过文中的分析就能提供各应力单元的三个主应力的空间方向与大小的信息.
Three-dimensional stress analysis is commonly used frozen slice method and astigmatism measurements. In 1970, Н.К.АЬеn proposed to change the plane stress of each slice by changing the polarization state or wavelength of incident light. Up to now, no perfect optical slicing method has been found in the measurement and analysis of three-dimensional principal stress σ_1, σ_2 and σ_3. In this paper, the method of Н.К. АЬеn is generalized to the plate-shaped force component, the wavelength of incident light is changed, the polarization property is measured in three directions, and the interference light photo or holographic photo-elastic is combined in the thickness direction, The analysis provides information on the spatial orientation and size of the three principal stresses of each stress cell.