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利用半导体PN结压降的固有温度特性,设计了一种可实现功率芯片结温检测控制的电路。在线路参数理论推导的基础上,给出了各元件的选取方法,以及检测元件与被测元件间的工艺实现方案。该电路可用于混合集成电路中功率芯片的结温检测,可产生过温保护电路所需要的触发信号,具有成本低、参数调整方便、检测点数扩展简单等特点。
By using the inherent temperature characteristic of the PN junction voltage drop, a circuit to detect and control the junction temperature of the power chip is designed. Based on the theoretical derivation of the circuit parameters, the method of choosing each component and the scheme of the process between the detecting component and the device under test are given. The circuit can be used to detect the junction temperature of power chips in hybrid integrated circuits and can generate trigger signals required by over-temperature protection circuits. The circuit has the characteristics of low cost, convenient parameter adjustment and simple expansion of detection points.