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文章介绍了基于 IEEE1149.1协议的 LS－ JTAG边界扫描测试系统的设计和实现。系统以 LS－ JTAG主控器为核心，可以实现对支持协议的 VLSI、 PCB、 MCM和其它数字系统进行边界扫描测试。
The paper introduces the design and implementation of LS-JTAG boundary scan test system based on IEEE1149.1 protocol. The system is based on the LS-JTAG master and allows boundary-scan testing of VLSI, PCB, MCM and other digital systems supporting the protocol.