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前言对于分析方法,特别是工业分析方法,一般都希望不使用价格昂贵的特殊装置;操作简便;不论何人、何时、何地使用均能得到可靠的数据。而分光光度法在相当程度上能满足这样的要求。虽然现在各种仪器分析方法得到了迅速的发展,但分光光度法仍然广泛应用于各个领域,日本工业标准等法定的分析方法亦采用分光光度法,其原因恐怕就在于此。如果能将分光光度法韵应用范围从以往的痕量成分分析扩大到超痕量成分分析,那将是非常理想的。从这个观点出发,
Preface Analytical methods, in particular industrial analytical methods, are generally expected not to use expensive special equipment; they are easy to use and depend on who, when and where they are used for reliable data. The spectrophotometry to a considerable extent to meet such a request. Although a variety of instrumental analysis methods have been developed rapidly, spectrophotometry is still widely used in various fields. The reason why the statutory analytical methods such as the Japanese Industrial Standards also adopt spectrophotometry is the reason. It would be ideal if the range of spectrophotometric applications could be extended from trace analysis to ultratrace analysis. From this point of view,