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本文阐述了基于布尔函数的组合电路测试生成方法,给出了测试生成的基本运算规则及测试生成的算法——任意路径敏化法。该算法适用于布尔函数的任何表示形式。与基于布尔函数的其它算法相比,该算法不用复杂的布尔运算,只须按给出的规则作简单的判断和计算就可以生成给定故障的测试码,因而计算工作量要小得多。该算法用于大型组合电路的测试生成,可以增加扇出分支处的唯一敏化条件,减少信号冲突和回溯次数,大大加快了大规模组合电路以及印制电路板的测试生成速度。
In this paper, the test generation method of combinational circuit based on Boolean function is expounded, and the basic computing rules of test generation and the algorithm of test generation - arbitrary path sensitization method are given. This algorithm is suitable for any representation of Boolean functions. Compared with other algorithms based on Boolean functions, the algorithm does not need complicated Boolean operations. It only needs to make simple judgment and calculation according to the given rules to generate the test code of a given fault, so the computational workload is much smaller. The algorithm is used to test the generation of large combinational circuits, which can increase the unique sensitization conditions at the fan-out branches and reduce the number of signal collisions and backtracking, greatly accelerating the test generation speed of large-scale combinational circuits and printed circuit boards.