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对某炉批GH3230板材进行兰姆波检测时发现了部分板材局部杂波程度偏高,对引起杂波的板材组织进行了金相取样观察,通过对比发现板材组织并未见异常。将杂波偏高的板材放置两个月后发现杂波程度降低,结合表面波检测结果和板材热处理情况分析,得出了板材残余应力引起兰姆波检测杂波显示的可能性最大。从该炉板材上选取有杂波区域的板材进行高温去应力后的检测试验对比,验证得出残余应力是引起该炉板材杂波偏高的原因。
When a furnace batch GH3230 plate was tested by Lamb wave, the local clutter of partial plate was found to be high, and the metallographic sample of the plate caused by clutter was observed. No abnormalities were found in the plate tissue by comparison. After the clutter with high plate was placed for two months, it was found that the degree of clutter was reduced. Combined with the result of surface wave detection and the analysis of plate heat treatment, it was concluded that the residual stress of slab was the most likely to cause Lamb wave to detect clutter. A comparison of the test results of the plate with clutter area under high temperature stress after stress removal from the plate material shows that the residual stress is the cause of the high clutter wave of the plate material.