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在应用GE公司的超声波检测仪和超声波探头时,为了方便常常会直接在工件上调DGS曲线,以此作为检测灵敏度和定量基准。但实际上DGS曲线和DAC曲线在缺陷定量上有很大差异。对于GE公司的SEB2探头,当检测深度>25mm时,测量值与实际值相比较为准确;当检测深度≤25mm时,测量值与实际值相比差别较大。根据实际使用经验,双晶直探头的定量用DAC法较为准确。
When using GE’s ultrasonic and ultrasonic probes, it is often convenient to directly up-regulate the DGS curve on the workpiece as a basis for detection sensitivity and quantitation. But in fact DGS curve and DAC curve have very big difference in defect quantitatively. For the GE SEB2 probe, when the detection depth> 25mm, the measured value is more accurate than the actual value; when the detection depth is less than 25mm, the measured value differs greatly from the actual value. According to the actual use of experience, dual-crystal straight probe quantitative DAC method is more accurate.