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研究了液晶分子排列对哈特曼波前探测器探测及闭环校正的影响.首先分析了分子排列对液晶校正器产生漏光强度的影响.详细探讨了在闭环校正过程中漏光对波前探测及校正准确度影响,当漏光比为40%时,产生的探测偏离误差为0.4;对于8%的漏光比,探测误差仅为0.08,可以忽略.最后分别做了扭曲和平行排列液晶校正器对静态畸变的闭环校正实验.对于漏光比为40%的扭曲液晶校正器,校正前后的PV和RMS值分别为:1.11μm、0.25μm和1.08μm、0.24μm,说明漏光对闭环校正产生了严重影响.对于漏光比为8%的平行排列液晶校正器,通过闭环校正,波前的PV和RMS分别从1.58m和0.22m降到0.095m和0.03m,同时获得清晰的光纤束的像.结果表明,如果能够控制液晶波前校正器的漏光占总光强的比在8%以下,则可以获得高校正准确度.
The influence of molecular alignment on the detection and the closed-loop correction of the Hartmann’s wavefront detector is studied. The effect of the molecular alignment on the light leakage intensity of the liquid crystal corrector is analyzed. The detection and correction of the wavefront in the closed-loop correction Accuracy, when the light leakage ratio of 40%, the resulting detection deviation error of 0.4; 8% of the leakage ratio, the detection error of only 0.08, can be ignored.Finally made twisted and parallel aligned liquid crystal corrector static distortion Closed-loop calibration experiment.For the distorted liquid crystal corrector with a leakage ratio of 40%, the PV and RMS values before and after calibration are 1.11μm, 0.25μm and 1.08μm, 0.24μm, respectively, which indicates that light leakage has a serious impact on the closed- Through the closed-loop correction, the PV and RMS of the wavefront are reduced from 1.58m and 0.22m to 0.095m and 0.03m, respectively, and a clear image of the optical fiber bundle is obtained. The results show that if Can control the liquid crystal wavefront corrector light leakage than the total light intensity ratio of 8% or less, you can get high calibration accuracy.