本文介绍了一种适合硅粒子探测器的自动中测系统。可同时测量１６个样品，全部由微机控制。数据存放在微机中，可以给出统计数据，也可绘出特性曲线，从而大大提高了测试效率与质量。目前用于测量硅粒子探测器反向Ｉ－Ｖ曲线。实验表明：本装置测得的数据是可靠的，并大大提高了效率。 This article describes an automatic measurement system suitable for silicon particle detectors. Can measure 16 samples at the same time, all controlled by the microcomputer. Data stored in the computer, you can give statistics, but also draw the characteristic curve, which greatly improves the test efficiency and quality. Currently used to measure reverse I-V curve of silicon particle detectors. Experiments show that: The device measured data is reliable, and greatly improve the efficiency.