The analog frontend (AFE) coupling circuit is a crucial processing element for data acquisition systems based on analog-to-digital converters (ADCs).Currently,high-speed and high-resolution ADCs are predominantly designed with differential input stages.Conventional highspeed ADC drivers are mainly AC-coupled by employing transformers (Baluns) or fully differential amplifiers (FDAs) with blocking capacitors.However,the results of this study indicate that a certain degree of DC offset error exists and manifests itself as the baseline error in the presence of power dividers connecting several DC-coupled channels that implement high-dynamic-range (HDR) signal conditioning.The study involves a theoretical analysis and explanation of the baseline offset error.The offset error can potentially lead to unexpected out-of-range issues for sampling devices,including high-speed ADCs and switched capacitor array ASICs.High-performance FDAs are adopted,and an offset-free DC-coupled AFE circuit is proposed to address the aforementioned issue using twostage amplification and a resistive attenuator.The proposed methodology is verified via circuit simulations and hardware design.Thus,the baseline offset problem can be accurately solved using the proposed circuit by minimizing the neglectable error.The proposed circuit facilitates improvements in the high-precision measurement of HDR signals in many nuclear physics experiments and some applications in the DC-coupling scheme with FDAs involving resistive power dividers.