论文部分内容阅读
扫描电子显微镜(以下简称扫描电镜)在建筑材料研究中的应用正日益受到人们的重视。这主要因为扫描电镜具有一般光学显微镜和透射电子显微镜所不具备的特点。例如能够对试样直接进行观察,而且焦深大,图形立体感强,试样的加工亦比较简单。此外在放大倍数方面填补了光学显微镜和透射电镜之间的空白。近年来由于电子探针术和能谱仪的使用,可以对所观察物体进行成分分
Scanning electron microscopy (hereinafter referred to as scanning electron microscopy) has attracted increasing attention in the application of building materials. This is mainly because scanning electron microscopes have characteristics that are not available in general light microscopes and transmission electron microscopes. For example, the sample can be directly observed, and the depth of focus is large, the three-dimensional pattern is strong, and the processing of the sample is relatively simple. In addition, the gap between the optical microscope and the transmission electron microscope is filled in the magnification. In recent years, due to the use of electron probes and energy spectrometers, the observed objects can be divided into