如同用透射光显微镜一样,用反射光显微镜,正交偏光镜下的矿物性状在鉴定时也是一种重要的现象。虽然偏光色及其亮度在垂直照射时变得与本来性质完全不同,但这种偏光色的亮度与薄片双折射强度相似,在鉴定工作中也被用来作为衡量非均质性的尺度。 用透射光显微镜测量双折射被视为一种简单而精确的光学测量方法;然而由于缺少一种适宜而简单的测量方法,到目前为止,对于反射光显微镜下非均质 As with the transmission light microscope, with the reflection light microscope, the orthogonality of mineral properties under the polarizer in the identification is also an important phenomenon. Although the polarizing color and its brightness become completely different from the original property when irradiated vertically, the brightness of this polarizing color is similar to that of the sheet birefringence and is also used as a measure of heterogeneity in the identification work. Measuring birefringence with a transmission light microscope is considered as a simple and accurate optical measurement method; however, due to the lack of a suitable and simple measurement method, so far, it has been found that for heterogeneous reflection light microscopy